Surface Layer Research Laboratory
The laboratory conducts research:
- fractographic surfaces,
- topography and geometric structure of surfaces in 2D and 3D,
- microhardness of the top layer,
- the distribution of residual stresses in the surface layer,
- wettability of solids
List of service and research work for the needs of the industrial environment that can be carried out in the laboratory:
- contact and non-contact surface roughness measurements of machine and device elements,
- measurements of microhardness distribution in surface layers of machine and device elements,
- measurements of residual stress distribution in surface layers of machine and device elements,
- measurements of wettability of solids.
The main research equipment of the laboratory:
Testing the reaction of liquids with the surface of solids for materials such as polymers, metals, films, paper and cardboard. Equipped with a video camera capable of recording 15 images per second, it is used to measure the static and dynamic contact angle and the absorption rate.
Contact person: Ryszard Perłowski, D.Sc. Eng. firstname.lastname@example.org
Phenom ProX scanning electron microscope system
The system allows for collecting high-quality optical and electronic images in a very short time, as well as analyzing the chemical composition.
The Phenom Pro microscope provides the ability to obtain images with magnification up to 150,000x, while ensuring their high quality and large depth of field.
Characteristics of the Phenom ProX scanning electron microscope:
- magnification: up to 150,000x
- long life of the electron source (up to 1500 hours)
- source of electrons optimized for the possibility of achieving high resolutions - 10 nm for the BSE detector, 8 nm for the SE detector
- CeB6 cathode working with an accelerating voltage of 5kV, 10kV and 15kV - resolution improvement (adjustment every 0.1kV in the range of 4.8kV - 15kV)
- detector of backscattered electrons, with the ability to work in two modes:
- the ability to archive images in the following formats: TIFF, JPEG, BMP
- the integrated EDS spectrometer enables elemental analysis of the chemical composition
- time needed to obtain the image:
- optical: 5 seconds
- electron: 30 seconds
- easy to use, intuitive user interface
Contact person: Jarosław Sęp, +48 17 8651512 , email@example.com
Station for measuring residual stress distribution in the surface layer using the reduction method
Universal microscope NMM 800 TRF with the possibility of recording movies and photos
Reichert KL-2 micro hardness tester
Taylor-Hobson Surtronic 25 contact profilometer
Optical profilometer Talysurf CCI Lite
Research into the topography of various surfaces in the 2D (120 parameters) and 3D (40 parameters) system.
Contact person: Prof. Pawel Pawlus, D.Sc. PhD. Eng. +48 17 8651183, firstname.lastname@example.org